Published on IESL-FORTH (https://cc-webserver.iesl.forth.gr)

Researcher ID [1]
Office Phone: (+30) 2810 39 4123
Lab Phone: (+30) 2810 39 4140, 4142
Email: eaper@physics.uoc.gr
Full CV: Download [2]
Publications PDF: Download [3]
Dr. Aperathitis Elias
Senior application Scientist

Education

  • 1989, Ph.D., Applied Physics Dpt, Hull University, Hull England, U.K.
  • 1984, M.Sc, Physics Dpt, Dundee University, Dundee Scotland, U.K.
  • 1983, B.Sc, Physics Dpt, University of Patra, Patra, Greece

Career

  • 2024 - today, Senior Scientist, Microelectronics Research Group, FORTH - IESL, Greece
  • 2019 – today, Member of Health & Safety Committee of employees at FORTH-Heraklion, Crete
  • 2017 - today, Safety manager, Microelectronics Rersearch Group, FORTH - IESL, Greece
  • 2004 - 2024, Principal application acientist, Microelectronics Rersearch Group, FORTH - IESL, Greece
  • 2000 – 2005 Adjunct Professor, Department of Applied Information & Multimedia, School for Technological Applications, Tecnological Educational Institute, Crete, Greece
  • 1992 - 2000, Adjunct Professor, Physics Department, Crete University, Crete, Greece.
  • 1991 - 2004, Application acientist, Microelectronics Rersearch Group, FORTH - IESL, Greece

Interests

  • Oxide-based thin film materials & devices for transparent optoelectronic applications
  • Photovoltaics (transparent and non-transparent)
  • Materials and devices for smart windows and energy efficient buildings
  • Nanostructured materials based on strongly correlated oxides for energy saving and storage.
Sputtered VO2 coatings on commercial glass substrates for smart glazing applications
E. Gagaoudakis, E. Aperathitis, G. Michail, G. Kiriakidis, V. Binas
solmat, Volume:Solar Energy Materials & Solar Cells , Issue:220, Page:110845, Year:2021, DOI:doi.org/10.1016/j.solmat.2020.110845 [4]
Anion and Cation Co-Doping of NiO for Transparent Photovoltaics and Smart Window Applications,
Ch. Aivalioti, E.G. Manidakis, N.T. Pelekanos, M. Androulidaki, K. Tsagaraki, E. Aperathitis
Crystals, Volume:Crystals , Issue:14, Page:629, Year:2024, DOI:doi.org/10.3390/cryst14070629 [5]
Long-term stability of transparent n/p ZnO homojunctions grown by rf-sputtering at room-temperature
V. Kampylafka, A. Kostopoulos, M. Modreanu, M. Schmidt, E. Gagaoudakis, K. Tsagaraki, V. Kontomitrou, G. Konstantinidis, G. Deligeorgis, G. Kiriakidis, E. Aperathitis
JMat, Volume:Journal of Materiomics , Issue:5, Page:428-435, Year:2019, DOI:doi.org/10.1016/j.jmat.2019.02.006 [6]
Oxygen-vacancy induced ferroelectricity in nitrogen-doped nickel oxide
Mircea Dragoman, Silviu Vulpe, Elias Aperathithis, Chrysa Aivalioti, Cosmin Romanitan, Adrian Dinescu, Daniela Dragoman, Martino Aldrigo, Nikolay Djourelov, Mircea Modreanu, and Antoniu Moldovan
Journal of Applied Physics, Volume: Volume 131, Issue:16, Page:pp.1-11, Year:2022, DOI:doi.org/10.1063/5.0075568 [7]
An Assessment of Sputtered Nitrogen-Doped Nickel Oxide for all-Oxide Transparent Optoelectronic Applications: The Case of Hybrid NiO:N/TiO2 Heterostructure
Aivalioti, C. ., Papadakis, A. ., Manidakis, E. ., Kayambaki, M. ., Androulidaki, M. ., Tsagaraki, K. ., T. Pelekanos, N. ., Stoumpos, C. ., Modreanu, M. ., Craciun, G. ., Romanitan, C. ., & Aperathitis , E
Recent Trends in Chemical and Material Sciences, Volume:Vol. 6, Page:Chap. 8 Page 86-111, Year:2022, DOI:doi.org/10.9734/bpi/rtcams/v6/1650A [8]
Study on the Ozone Gas Sensing Properties of rf-Sputtered Al-Doped NiO Films
Paralikis, A., Gagaoudakis, E., Kampitakis, V., Aperathitis, E.,Kiriakidis, G., Binas, V
Appl. Sci., Volume:11, Page:3104, Year:2021, DOI:doi.org/10.3390/app11073104 [9]
Influence of Mg doping on the ultrafast electron dynamics of VO2 films
Karanikolopoulos, D., Gagaoudakis, E., Droulias, S. et al.
Appl. Phys. A, Volume:127, Page:751, Year:2021, DOI:doi.org/10.1007/s00339-021-04886-y [10]
Transparent All-Oxide Hybrid NiO:N/TiO2 Heterostructure for Optoelectronic Applications
Aivalioti, C.; Papadakis, A.; Manidakis, E.; Kayambaki, M.; Androulidaki, M.; Tsagaraki, K.; Pelekanos, N.T.; Stoumpos, C.; Modreanu, M.; Crăciun, G.; Romanitan, C.; Aperathitis, E
Electronics 10 , Volume:988, Page:18pp, Year:2021, DOI:doi.org/10.3390/electronics10090988 [11]

Links
[1] http://www.researcherid.com/rid/O-2973-2013 [2] https://cc-webserver.iesl.forth.gr/sites/default/files/cv-en/EAperathitis%20CV%20with%20selected%20publications.pdf [3] https://cc-webserver.iesl.forth.gr/sites/default/files/publications/EAperathitis%20publications.pdf [4] https://doi.org/10.1016/j.solmat.2020.110845 [5] https://doi.org/10.3390/cryst14070629 [6] https://doi.org/10.1016/j.jmat.2019.02.006 [7] https://doi.org/10.1063/5.0075568 [8] https://doi.org/10.9734/bpi/rtcams/v6/1650A [9] https://doi.org/10.3390/app11073104 [10] https://doi.org/10.1007/s00339-021-04886-y [11] https://doi.org/10.3390/electronics10090988 [12] https://cc-webserver.iesl.forth.gr/en/research/TCM_group [13] https://cc-webserver.iesl.forth.gr/en/research/MRG_energy [14] https://cc-webserver.iesl.forth.gr/en/research/MRG_RF_systems