Publications

Modal Characterization using Principal Component Analysis: application to Bessel, higher-order Gaussian beams and their superposition

A. Mourka, M. Mazilu, E. M. Wright, K. Dholakia

Sci. Rep., 3, 1422, 2013, https://doi.org/10.1038/srep01422

Redox Multiphoton Polymerization for 3D Nanofabrication

Elmina Kabouraki, Argyro N. Giakoumaki, Paulius Danilevicius, David Gray, Maria Vamvakaki, Maria Farsari

Nano Lett., 13, 8, 3831-3835, 2013, https://doi.org/10.1021/nl401853k

Structural characteristics of single crystalline GaN films grown on (111) diamond with AlN buffer

B. Pécz, L. Tóth, A. Barna, G. Tsiakatouras, A.O. Ajagunna, A. Kovács, A. Georgakilas

Diamond and Related Materials, 34, 9 - 12, 2013, https://doi.org/10.1016/j.diamond.2013.01.005

Picosecond and subpicosecond pulsed laser deposition of Pb thin films

F. Gontad, A. Lorusso, A. Klini, A. Loufardaki, M. Panareo, C. Fotakis, A. Perrone

Phys. Rev. Spec TOP-AC, 16, 093401, 2013, 10.1103/PhysRevSTAB.16.093401

Wavelength and pulse duration effects on laser induced changes on raw pigments used in paintings

M.Oujja, M.Sanz, E.Rebollar, J.F.Marco, C.Domingo,P.Pouli, S.Kogou.C.Fotakis, M.Castillejo

Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy, 102, 7-14, 2013, doi.org/10.1016/j.saa.2012.10.001

Redox Multiphoton Polymerization for 3D Nanofabrication

4. Elmina Kabouraki, Argyro N. Giakoumaki, Paulius Danilevicius, David Gray, Maria Vamvakaki, and Maria Farsari

Nano Lett., 13, 3831-3835, 2013, https://doi.org/10.1021/nl401853k

Electronic and interface properties of polyfluorene films on GaN for hybrid optoelectronic applications

G. Itskos, X. Xristodoulou, E. Iliopoulos, S. Ladas, S. Kennou, M. Neophytou, and S. Choulis

Appl. Phys. Letters, 102, 063303, 2013, doi.org/10.1063/1.4792211

Development of Functional Polymer Surfaces with Controlled Wettability

S. H. Anastasiadis

Langmuir, 29, 30, 9277-9290, 2013, doi.org/10.1021/la400533u

Comparative study of Laser Induced Breakdown Spectroscopy and Mass Spectrometry for the analysis of cultural heritage materials

O. Kokkinaki, C. Mihesan, M. Velegrakis, D. Anglos, J. Molec

Structure , 1044, 160-166 , 2013, dx.doi.org/10.1016/j.molstruc.2013.01.069

Growth mechanism and microstructure of low defect density InN (0001) In-face thin films on Si (111) substrates

Th. Kehagias, G. P. Dimitrakopulos, A. O. Ajagunna, T. Koukoula, K. Tsagaraki, A. Adikimenakis, Ph. Komninou and A. Georgakilas

Journal of Applied Physics, 114, 163519, 2013, https://doi.org/10.1063/1.4827396

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